From direct ion images to ion probe scanning
نویسندگان
چکیده
منابع مشابه
Ion Implantation with Scanning Probe Alignment
We describe a scanning probe instrument which integrates ion beams with the imaging and alignment function of a piezo-resistive scanning probe in high vacuum. The beam passes through several apertures and is finally collimated by a hole in the cantilever of the scanning probe. The ion beam spot size is limited by the size of the last aperture. Highly charged ions are used to show hits of single...
متن کاملScanning Ion Conductance Microscopy
Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-fo...
متن کاملScanning Ion Conductance Microscopy
Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-fo...
متن کاملScanning Ion Conductance Microscopy
Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-fo...
متن کاملPhotofragment Alignment from Abel-Invertible Ion Images
T. Peter Rakitzis,1,3,* Peter C. Samartzis,2,3 and Theofanis N. Kitsopoulos2,3 1Department of Physics, University of Crete, P.O. 2208, 71003 Voutes-Heraklion, Greece 2Department of Chemistry, University of Crete, Leof. Knosou, 71409 Heraklion, Greece 3Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas, 711 10 Heraklion-Crete, Greece (Received 16 January 2...
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ژورنال
عنوان ژورنال: Microscopy Microanalysis Microstructures
سال: 1992
ISSN: 1154-2799
DOI: 10.1051/mmm:0199200302-309900